Accurate performance evaluation for the horizontal nanosheet standard-cell design space beyond 7nm technologyYoo-Mi LeeMyung-Hee Naet al.2017IEDM 2017
A fully automated method to create Monte-Carlo MOSFET model libraries for statistical circuit simulationsJing WangHenry Trombleyet al.2012NSTI-Nanotech 2012
Including spatial correlations of channel length and threshold voltage variation in circuit simulationsJosef WattsHenry Trombley2012Microelectronics Reliability
Chip-level power-performance optimization through thermally-driven across-chip variation (ACV) reductionX. YuOleg Gluschenkovet al.2011IEDM 2011