Effect of hot carrier stress on device junctions measured by electron holography and scanning capacitance microscopy
- Yun-Yu Wang
- J. Nxumalo
- et al.
- 2018
- Applied Physics Letters
Paper
Publications
5 results for J. Nxumalo
Junction profiling on hot carrier stressed device by dual lens electron holography and scanning capacitance microscopy
- Yun-Yu Wang
- J. Nxumalo
- et al.
- 2018
- IWJT 2018
Conference paperCharacterizing junction profiles in Ge photodetectors using scanning capacitance microscopy (SCM) and electron holography
- J. Nxumalo
- Yun-Yu Wang
- et al.
- 2018
- IWJT 2018
Conference paperLeakage issues in failure analysis of P+ SiGe active area short monitor
- Ankur Arya
- Greg M. Johnson
- et al.
- 2011
- IPFA 2011
Conference paperEvaluation of emitter profiles and lateral uniformity on crystalline silicon photovoltaic cells using scanning capacitance microscopy
- Laura Kosbar
- Jochonia Nxumalo
- et al.
- 2010
- PVSC 2010
Conference paper