Impact of hot-carrier degradation on drain-induced barrier lowering in multifin SOI n-Channel FinFETs with self-heating
- Charu Gupta
- Anshul Gupta
- et al.
- 2020
- IEEE T-ED
Paper
Publications
8 results for Charu Gupta
Impact of LER on Mismatch in Nanosheet Transistors for 5nm-CMOS
- Chandan Kumar Jha
- Charu Gupta
- et al.
- 2020
- EDTM 2020
Conference paperComparison of LER induced mismatch in NWFET and NSFET for 5-nm CMOS
- Chandan Kumar Jha
- Pritam Yogi
- et al.
- 2020
- IEEE J-EDS
PaperImpact of Hot Carrier Stress on RF FOMs in 10-nm Bulk N-Channel FinFETs
- Anshul Gupta
- Charu Gupta
- et al.
- 2019
- IIRW 2019
Conference paperReliability Modeling and Analysis of Hot-Carrier Degradation in Multiple-Fin SOI n-Channel FinFETs With Self-Heating
- Anshul Gupta
- Charu Gupta
- et al.
- 2019
- IEEE T-ED
PaperSeries Resistance Reduction with Linearity Assessment for Vertically Stacked Junctionless Accumulation Mode Nanowire FET
- Anil K. Bansal
- Manoj Kumar
- et al.
- 2018
- IEEE T-ED
Paper3-D LER and RDF Matching Performance of Nanowire FETs in Inversion, Accumulation, and Junctionless Modes
- Anil K. Bansal
- Charu Gupta
- et al.
- 2018
- IEEE T-ED
PaperAnalytical Modeling of Parasitic Capacitance in Inserted-Oxide FinFETs
- R. Singh
- Anshul Gupta
- et al.
- 2017
- IEEE T-ED
Paper