Concentration and chemical-state profiles at heterogeneous interfaces with sub-nm accuracy from standing-wave ambient-pressure photoemission
- Slavomír Nemšák
- Andrey Shavorskiy
- et al.
- 2014
- Nature Communications
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Chemical and structural characterization of EUV photoresists as a function of depth by standing-wave x-ray photoelectron spectroscopy
- Giuseppina Conti
- Henrique P. Martins
- et al.
- 2021
- JM3