Performance evaluation of a high-quality TDI-CCD color scanner
- Hon-Sum Wong
- Whan-Soo Kang
- et al.
- 1992
- IS&T/SPIE Electronic Imaging 1992
Conference paper
Publications
114 results for H.-S. Philip Wong
Experimental Verification of the Mechanism of Hot-Carrier-Induced Photon Emission in N-MOSFET's using an Overlapping CCD Gate Structure
- Hon-Sum Wong
- 1992
- IEEE Electron Device Letters
PaperTDI charge-coupled devices: Design and applications
- H.-S. Wong
- Ying L. Yao
- et al.
- 1992
- IBM J. Res. Dev
PaperExperimental verification of the mechanism of hot-carrier-induced photon emission in n-MOSFET's with a CCD gate structure
- Hon-Sum Wong
- 1991
- IEDM 1991
Conference paper