Publications

3 results for Paolo Pavan

Recommended Methods to Study Resistive Switching Devices
- - Mario Lanza
  - H.-S. Philip Wong
  - et al.
- 2018
- Advanced Electronic Materials
Extension of Impact-Ionization Multiplication Coefficient Measurements to High Electric Fields in Advanced Si BJT’s
- - Enrico Zanoni
  - Emmanuel F. Crabbé
  - et al.
- 1993
- IEEE Electron Device Letters
Measurements and simulation of avalanche breakdown in advanced Si bipolar transistors
- - E. Zanoni
  - E.F. Crabbe
  - et al.
- 1992
- IEDM 1992