Publications

2 results for Tuo Hung Hou

Recommended Methods to Study Resistive Switching Devices
- - Mario Lanza
  - H.-S. Philip Wong
  - et al.
- 2018
- Advanced Electronic Materials
Origin of the threshold voltage instability in SiO₂/HfO₂ dual layer gate dielectrics
- - A. Kerber
  - E. Cartier
  - et al.
- 2003
- IEEE Electron Device Letters