Improved reflectivity control of APEX-E positive tone deep-UV photoresistWillard ConleyRavindra Akkapeddiet al.1994Microlithography 1994
TAR processing for CD control in I-line and 248 nm lithographyChristopher LyonsNicholas Eibet al.1993Microlithography 1993
Negative tone aqueous developable resist for photon electron and X-ray lithographyWillard ConleyWayne Moreauet al.1990Microlithography 1990