Strained SOI FINFET SRAM design
- Pranita Kerber
- Rouwaida Kanj
- et al.
- 2013
- IEEE Electron Device Letters
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210 results for Rajiv V. Joshi
Hardware-corroborated variability-aware SRAM methodology
- Rajiv Joshi
- Rouwaida Kanj
- et al.
- 2013
- VLSID 2013
3-D-TCAD-based parasitic capacitance extraction for emerging multigate devices and circuits
- Ajay N. Bhoj
- Rajiv V. Joshi
- et al.
- 2013
- IEEE Transactions on VLSI Systems
Efficient methodologies for 3-D TCAD modeling of emerging devices and circuits
- Ajay N. Bhoj
- Rajiv V. Joshi
- et al.
- 2013
- IEEE TCADIS
A thermal and process variation aware MTJ switching model and its applications in soft error analysis
- Peiyuan Wang
- Wei Zhang
- et al.
- 2012
- ICCAD 2012
Isolated Preset Architecture for a 32nm SOI embedded DRAM macro
- John Barth
- Don Plass
- et al.
- 2012
- VLSI Circuits 2012
A novel sample reuse methodology for fast statistical simulations with applications to manufacturing variability
- Rouwaida Kanj
- Rajiv Joshi
- 2012
- ISQED 2012
Yield estimation via multi-cones
- Rouwaida Kanj
- Rajiv Joshi
- et al.
- 2012
- DAC 2012
Transport-analysis-based 3-D TCAD capacitance extraction for sub-32-nm SRAM structures
- Ajay N. Bhoj
- Rajiv V. Joshi
- 2012
- IEEE Electron Device Letters
Accelerated statistical simulation via on-demand Hermite spline interpolations
- Rouwaida Kanj
- Tong Li
- et al.
- 2011
- ICCAD 2011