Characteristics of thermal stresses in Al(Cu) fine lines. II. Passivated line structures
- I.-S. Yeo
- S.G.H. Anderson
- et al.
- 1995
- Journal of Applied Physics
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Chemistry and morphology of Cr/BPDA-PDA interface formation
- Steven G. Anderson
- Jihperng Leu
- et al.
- 1993
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films