Stoichiometry reversal and depth-profiling in the growth of thin oxynitride films with N2O on Si(100) surfaces
- D.G.J. Sutherland
- H. Akatsu
- et al.
- 1996
- Journal of Electron Spectroscopy and Related Phenomena
Publications
10 results for J.A. Carlisle
Study of buried interfaces by soft x-ray fluorescence spectroscopy excited by synchrotron radiation
- D.L. Ederer
- J.A. Carlisle
- et al.
- 1996
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Resonant inelastic scattering in localized solid systems by soft X-ray fluorescence spectroscopy
- R.C.C. Perera
- J.J. Jia
- et al.
- 1996
- Journal of Electron Spectroscopy and Related Phenomena
First experimental results from IBM/TENN/TULANE/LLNL/LBL undulator beamline at the advanced light source
- J.J. Jia
- T.A. Callcott
- et al.
- 1995
- Review of Scientific Instruments
Occupied electronic states of CaSi2 and CaSi: Soft-x-ray-fluorescence spectroscopy
- J.J. Jia
- T.A. Callcott
- et al.
- 1995
- Physical Review B
Probing the graphite band structure with resonant soft-x-ray fluorescence
- J.A. Carlisle
- Eric L. Shirley
- et al.
- 1995
- Physical Review Letters
Stoichiometry reversal in the growth of thin oxynitride films on Si(100) surfaces
- D.G.J. Sutherland
- H. Akatsu
- et al.
- 1995
- Journal of Applied Physics
Surface and interface analysis at 3rd generation light sources
- F.J. Himpsel
- H. Akatsu
- et al.
- 1995
- Progress in Surface Science
Characterization of buried thin films with resonant soft x-ray fluorescence <AUTHGRP>
- J.A. Carlisle
- L.J. Terminello
- et al.
- 1994
- Applied Physics Letters
Occupied and unoccupied orbitals of c60 and c70
- J.A. Carlisle
- L.J. Terminello
- et al.
- 1994
- Molecular Crystals and Liquid Crystals Science and Technology. Section A. Molecular Crystals and Liquid Crystals