Ion scattering for in situ characterization of composition of La2-xSrxCuO4 films
- P.K. Hucknall
- S. Sugden
- et al.
- 1996
- Applied Physics Letters
Publications
2 results for C.J. Sofield
Ion scattering for in situ characterization of composition of La 2-xSrxCuO4 films
- P.K. Hucknall
- S. Sugden
- et al.
- 1995
- Applied Physics Letters