Grain boundary diffusion and electromigration in Cu-Sn alloy thin films and their VLSI interconnects
- D. Gupta
- C.-K. Hu
- et al.
- 1997
- Defect and Diffusion Forum
Publications
4 results for K.L. Lee
Electromigration and diffusion in pure Cu and Cu(Sn) alloys
- C.-K. Hu
- K.L. Lee
- et al.
- 1996
- MRS Spring Meeting 1996
Electromigration and diffusion in pure Cu and Cu(Sn) alloys
- C.-K. Hu
- K.L. Lee
- et al.
- 1996
- MRS Spring Meeting 1996
Electromigration drift velocity in Al-alloy and Cu-alloy lines
- C.-K. Hu
- K.Y. Lee
- et al.
- 1996
- JES