Bi-directional LEEM and eV-TEM spectroscopy on a graphene-hBN heterostack
- Peter S. Neu
- Eugene E. Krasovskii
- et al.
- 2025
- Ultramicroscopy
Publications
7 results for E. E. Krasovskii
Low-energy electron microscopy contrast of stacking boundaries: Comparing twisted few-layer graphene and strained epitaxial graphene on silicon carbide
- Tobias A. De Jong
- Xingchen Chen
- et al.
- 2023
- Physical Review B
Electron transmission and mean free path in molybdenum disulfide at electron-volt energies
- Peter S. Neu
- Makars Šiškins
- et al.
- 2023
- Physical Review B
Imaging moiré deformation and dynamics in twisted bilayer graphene
- Tobias A. de Jong
- Tjerk Benschop
- et al.
- 2022
- Nature Communications
Nonuniversal Transverse Electron Mean Free Path through Few-layer Graphene
- Daniël Geelen
- J. Jobst
- et al.
- 2019
- Physical Review Letters
Intrinsic stacking domains in graphene on silicon carbide: A pathway for intercalation
- T. A. de Jong
- E. E. Krasovskii
- et al.
- 2018
- Physical Review Materials
Quantifying electronic band interactions in van der Waals materials using angle-resolved reflected-electron spectroscopy
- J. Jobst
- A. J.H. van der Torren
- et al.
- 2016
- Nature Communications