Evaluation of the modified edge lift-off test for adhesion characterization in microelectronic multifilm applications
- Jack C. Hay
- Eric G. Liniger
- et al.
- 2001
- Journal of Materials Research
Paper
Publications
8 results for Jack C. Hay
Modified edge lift-off test: Experimental modifications for multifilm systems
- J.C. Hay
- E. Liniger
- et al.
- 2000
- MRS Online Proceedings Library
Conference paperFracture process zone modeling of monolithic Al2O3
- Z.K. Guo
- A.S. Kobayashi
- et al.
- 1999
- Engineering Fracture Mechanics
PaperCritical examination of the fundamental relations used in the analysis of nanoindentation data
- Jack C. Hay
- A. Bolshakov
- et al.
- 1999
- Journal of Materials Research
PaperMechanical- and physical-property changes of neutron-irradiated chemical-vapor-deposited silicon carbide
- Matthew C. Osborne
- Jack C. Hay
- et al.
- 1999
- JACerS
PaperExperimental investigations of the Sneddon solution and an improved solution for the analysis of nanoindentation data
- J.C. Hay
- G.M. Pharr
- 1998
- MRS Spring Meeting 1998
Conference paperApplicability of Sneddon relationships to the real case of a rigid cone penetrating an infinite half space
- J.C. Hay
- A. Bolshakov
- et al.
- 1998
- MRS Spring Meeting 1998
Conference paperElastic anisotropy of β-silicon nitride whiskers
- Jack C. Hay
- Ellen Y. Sun
- et al.
- 1998
- JACerS
Paper