Publications

2 results for Cristian Porta

High-speed CMOS circuit testing by 50 ps time-resolved luminescence measurements
- - Franco Stellari
  - Franco Zappa
  - et al.
- 2001
- IEEE Transactions on Electron Devices
Testing CMOS circuits at 50ps resolution with single-photon avalanche detectors
- - S. Cova
  - C. Porta
  - et al.
- 2000
- ESSDERC 2000