Publications

2 results for P.J.A. van Schendel

Atomic resolution imaging and frequency versus distance measurements on NiO(001) using low-temperature scanning force microscopy
- - R. Hoffmann
  - M.A. Lantz
  - et al.
- 2003
- Physical Review B - CMMP
Low temperature scanning force microscopy of the si(111)-(7×7) surface
- - M.A. Lantz
  - H.J. Hug
  - et al.
- 2000
- Physical Review Letters