Publications

2 results for J.D. Lee

An overview of 300mm SOI starting wafer quality and its yield detractors
- - Pei Y. Tsai
  - Marlene Almonte
  - et al.
- 2005
- ISTFA 2005
Qualification of 300 mm SOI CMOS substrate material: Readiness for development and manufacturing
- - H.J. Hovel
  - M. Almonte
  - et al.
- 2004
- Solid-State Electronics