New approaches for sample-profile estimation for fast atomic force microscopy
- Srinivasa M. Salapaka
- De Tathagata
- et al.
- 2005
- IMECE 2005
Publications
4 results for Srinivasa M. Salapaka
Design methodologies for robust nano-positioning
- Abu Sebastian
- Srinivasa M. Salapaka
- 2005
- IEEE TCST
A robust control based solution to the sample-profile estimation problem in fast atomic force microscopy
- Srinivasa M. Salapaka
- Tathagata De
- et al.
- 2005
- International Journal of Robust and Nonlinear Control
Sample-profile estimate for fast atomic force microscopy
- Srinivasa Salapaka
- Tathagata De
- et al.
- 2005
- Applied Physics Letters