Publications

8 results for Robert Wong

Incorporating process variation contours in design rule calculation and SRAM design optimization
- - Dongbing Shao
  - Jing Sha
  - et al.
- 2019
- SPIE Advanced Lithography 2019
Layout based Monte-Carlo simulation (LBMCS) for complex back end of line (BEOL) design rule study
- - Dongbing Shao
  - Lawrence Clevenger
  - et al.
- 2017
- IITC 2017
Super fast physics-based methodology for accurate memory yield prediction
- - Rajiv V. Joshi
  - Keunwoo Kim
  - et al.
- 2015
- IEEE Transactions on VLSI Systems
Product burn-in stress impacts on SRAM array performance
- - Li Wang
  - Qiuyi Ye
  - et al.
- 2007
- IRPS 2007
Impact of NBTI induced statistical variation to SRAM cell stability
- - Giuseppe La Rosa
  - Wee Loon Ng
  - et al.
- 2006
- IRPS 2006
High performance 45-nm SOI technology with enhanced strain, porous low-k BEOL, and immersion lithography
- - S. Narasimha
  - K. Onishi
  - et al.
- 2006
- IEDM 2006
SRAM Cell Design for Stability Methodology
- - Clement Wann
  - Robert Wong
  - et al.
- 2005
- VLSI Technology 2005
Dual stress liner for high performance sub-45nm gate length SOI CMOS manufacturing
- - H.S. Yang
  - R. Malik
  - et al.
- 2004
- IEDM 2004