Publications

2 results for Albert V. Davydov

Metrology for 2D materials: a perspective review from the international roadmap for devices and systems
- - Umberto Celano
  - Daniel Schmidt
  - et al.
- 2024
- Nanoscale Advances
Sub-bandgap defect states in polycrystalline hafnium oxide and their suppression by admixture of silicon
- - N.V. Nguyen
  - Albert V. Davydov
  - et al.
- 2005
- Applied Physics Letters