Site-specific force-distance characteristics on NaCl(001): Measurements versus atomistic simulations
- M.A. Lantz
- R. Hoffmann
- et al.
- 2006
- Physical Review B - CMMP
Publications
5 results for R. Hoffmann
Short-range electrostatic interactions in atomic-resolution scanning force microscopy on the Si(111)7×7 surface
- A. Lantz
- J. Hug
- et al.
- 2003
- Physical Review B - CMMP
Short-range electrostatic interactions in atomic-resolution scanning force microscopy on the Si(111) 7×7 surface
- M.A. Lantz
- H.J. Hug
- et al.
- 2003
- Physical Review B - CMMP
Atomic resolution imaging and frequency versus distance measurements on NiO(001) using low-temperature scanning force microscopy
- R. Hoffmann
- M.A. Lantz
- et al.
- 2003
- Physical Review B - CMMP
Low temperature scanning force microscopy of the si(111)-(7×7) surface
- M.A. Lantz
- H.J. Hug
- et al.
- 2000
- Physical Review Letters