Graded spin-on organic bottom antireflective coating for high NA lithographyDario L. GoldfarbSean D. Burnset al.2008SPIE Advanced Lithography 2008
Trilayer development for 193 nm immersion lithographySean BurnsMartin Burkhardtet al.2007J. Photopolym. Sci. Tech.
Silicon containing polymer in applications for 193 nm high NA lithography processesScan BumsDirk Pfeifferet al.2006SPIE Advanced Lithography 2006