Performance, reliability, radiation effects, and aging issues in microelectronics - From atomic-scale physics to engineering-level modeling
- Sokrates T. Pantelides
- L. Tsetseris
- et al.
- 2009
- ECS Meeting 2009
Publications
4 results for S.N. Rashkeev
Negative bias-temperature instabilities in metal-oxide-silicon devices with SiO 2 and SiO xN y/HfO 2 gate dielectrics
- X.J. Zhou
- L. Tsetseris
- et al.
- 2004
- Applied Physics Letters
Molecular electronics by the numbers
- Sokrates T. Pantelides
- Massimiliano Di Ventra
- et al.
- 2002
- IEEE TNANO
Molecular electronics by the numbers
- S.T. Pantelides
- M. Di Ventra
- et al.
- 2002
- ICCN 2002