Publications

169 results for Jim Stathis

Hot-carrier degradation in undoped-body etsoi fets and soi finfets
- - Miaomiao Wang
  - Pranita Kulkarni
  - et al.
- 2010
- IRPS 2010
PBTI relaxation dynamics after ac VS. DC stress in high-K/metal gate stacks
- - K. Zhao
  - J.H. Stathis
  - et al.
- 2010
- IRPS 2010
High-K gate stack breakdown statistics modeled by correlated interfacial layer and high-k breakdown path
- - G. Ribes
  - P. Mora
  - et al.
- 2010
- IRPS 2010
Reliability of advanced high-k/metal-gate n-FET devices
- - J.H. Stathis
  - M. Wang
  - et al.
- 2010
- Microelectronics Reliability
Extremely scaled gate-first high-k/metal gate stack with EOT of 0.55 nm using novel interfacial layer scavenging techniques for 22nm technology node and beyond
- - K. Choi
  - H. Jagannathan
  - et al.
- 2009
- VLSI Technology 2009
Impact of NBTI and PBTI in SRAM bit-cells: Relative sensitivities and guidelines for application-specific target stability/performance
- - Aditya Bansal
  - Rahul Rao
  - et al.
- 2009
- IRPS 2009
The effect of interface thickness of high-k/metal gate stacks on NFET dielectric reliability
- - Barry P. Linder
  - Eduard Cartier
  - et al.
- 2009
- IRPS 2009
Copper contact metallization for 22 nm and beyond
- - Soon-Cheon Seo
  - Chih-Chao Yang
  - et al.
- 2009
- IITC 2009
Recovery study of negative bias temperature instability
- - Miaomiao Wang
  - Sufi Zafar
  - et al.
- 2009
- Microelectronic Engineering
Impacts of NBTI and PBTI on SRAM static/dynamic noise margins and cell failure probability
- - Aditya Bansal
  - Rahul Rao
  - et al.
- 2009
- Microelectronics Reliability