Publications

2 results for Hyotae Choo

Gate-induced-drain-leakage current in 45-nm CMOS technology
- - Xiaohin Yuan
  - Jae-Eun Park
  - et al.
- 2008
- IEEE T-DMR
Characterization and analysis of gate-induced-drain-leakage current in 45 nm CMOS technology
- - Xiaobin Yuan
  - Jae-Eun Park
  - et al.
- 2007
- IIRW 2007