Publications

2 results for Yu. Babain

200 and 300 MeV/nucleon nuclear reactions responsible for single-event effects in microelectronics
- - H. Jäderström
  - Yu. Murin
  - et al.
- 2008
- Physical Review C - Nuclear Physics
A detector system for studying nuclear reactions relevant to Single Event Effects
- - Yu. Murin
  - Yu. Babain
  - et al.
- 2007
- Nucl. Instrum. Methods Phys. Res