Modeling and forecasting of defect-limited yield in semiconductor manufacturing
- Michael Baron
- Asya Takken
- et al.
- 2008
- IEEE Trans Semicond Manuf
Paper
Publications
8 results for Mary Lanzerotti
Impact of interconnect length changes on effective materials properties (dielectric constant)
- Mary Y. Lanzerotti
- Giovanni Fiorenza
- et al.
- 2007
- SLIP 2007
Conference paperDesign of the Power6™ microprocessor
- Joshua Friedrich
- Bradley McCredie
- et al.
- 2007
- ISSCC 2007
Conference paperPredicting interconnect requirements in ultra-large-scale integrated control logic circuitry
- M.Y. Lanzerotti
- G. Fiorenza
- et al.
- 2005
- SLIP 2005
Conference paperCharacterization of the impact of interconnect design on the capacitive load driven by a global clock distribution
- G.G. Lopez
- G. Fiorenza
- et al.
- 2005
- GLSVLSI 2005
Conference paperMicrominiature packaging and integrated circuitry: The work of E. F. Rent, with an application to on-chip interconnection requirements
- Mary Yvonne Lanzerotti
- Giovanni Fiorenza
- et al.
- 2005
- IBM J. Res. Dev
ReviewInterpretation of Rent's rule for ultralarge-scale integrated circuit designs, with an application to wirelength distribution models
- Mary Yvonne Lanzerotti
- Giovanni Fiorenza
- et al.
- 2004
- IEEE Transactions on VLSI Systems
PaperAssessment of on-chip wire-length distribution models
- Mary Y. Lanzerotti
- Giovanni Fiorenza
- et al.
- 2004
- IEEE Transactions on VLSI Systems
Paper