Iddq test: Sensitivity analysis of scaling
- T.W. Williams
- R.H. Dennard
- et al.
- 1996
- IEEE ITC 1996
Conference paper
Publications
3 results for M.R. Mercer
Iddq testing for high performance CMOS - the next ten years
- T.W. Williams
- R. Kapur
- et al.
- 1996
- EDTC 1996
Conference paperIddq testing for high performance CMOS - The next ten years
- T.W. Williams
- R. Kapur
- et al.
- 1996
- EDTC 1996
Conference paper