Publications

25 results for Anne Gattiker

Data analysis techniques for CMOS technology characterization and product impact assessment
- - Anne Gattiker
  - Manjul Bhushan
  - et al.
- 2006
- IEEE ITC 2006
Ring oscillator based technique for measuring variability statistics
- - Manjul Bhushan
  - Mark B. Ketchen
  - et al.
- 2006
- ICMTS 2006
High-performance CMOS variability in the 65-nm regime and beyond
- - Kerry Bernstein
  - David J. Frank
  - et al.
- 2006
- IBM J. Res. Dev
IC failure mechanisms yesterday, today, tomorrow: Implications from test to DFM
- - Anne Gattiker
- 2006
- ISPD 2006
Ring oscillators for CMOS process tuning and variability control
- - Manjul Bhushan
  - Anne Gattiker
  - et al.
- 2006
- IEEE Trans Semicond Manuf
Defects yesterday, today and tomorrow: Implications for test
- - Anne Gattiker
- 2006
- DBT 2006
Photon emission microscopy of inter/intra chip device performance variations
- - S. Polonsky
  - M. Bhushan
  - et al.
- 2005
- ESREF 2005
Diagnosis meets physical failure analysis: How long can we succeed?
- - Anne Gattiker
- 2004
- IEEE ITC 2004
Random and systematic defect analysis using IDDQ signature analysis for understanding fails and guiding test decisions
- - Phil Nigh
  - Anne Gattiker
- 2004
- IEEE ITC 2004
Power supply transient signal analysis for defect-oriented test
- - Jim Plusquellic
  - Abhishek Singh
  - et al.
- 2003
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems