Non-invasive timing analysis of IBM G6 microprocessor L1 cache using backside time-resolved hot electron luminescence
- S. Polonsky
- D.R. Knebel
- et al.
- 2000
- ISSCC 2000
Conference paper
Publications
18 results for Daniel R. Knebel
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis
- M. McManus
- J.A. Kash
- et al.
- 2000
- Microelectronics Reliability
PaperPicosecond Imaging Circuit Analysis of the IBM G6 Microprocessor Cache
- Moyra McManus
- Pia Sanda
- et al.
- 1999
- ISTFA 1999
Conference paperDiagnosis and characterization of timing-related defects by time-dependent light emission
- D.R. Knebel
- P.N. Sanda
- et al.
- 1998
- IEEE ITC 1998
Conference paperWhen are transmission-line effects important for on-chip interconnections?
- Alina Deutsch
- Gerard V. Kopcsay
- et al.
- 1997
- IEEE T-MTT
PaperImportance of inductance and inductive coupling for on-chip wiring
- A. Deutsch
- H. Smith
- et al.
- 1997
- IEEE Topical Meeting EPEPS 1997
Conference paperWhen are transmission-line effects important for on-chip interconnections
- A. Deutsch
- G.V. Kopcsay
- et al.
- 1997
- ECTC 1997
Conference paperDesign guidelines for short, medium, and long on-chip interconnections
- A. Deutsch
- W.D. Becker
- et al.
- 1996
- IEEE Topical Meeting EPEPS 1996
Conference paper