Resistivity scaling study of topological CoSi wires for interconnects beyond copperGuy CohenFranco Stellariet al.2026VLSI Technology and Circuits 2026Conference paper
Highly textured (100)-oriented and (111)-oriented, cobalt mono silicide nanoribbons: material growth and device fabricationGuy CohenPeter Kernset al.2024MRS Spring Meeting 2024Conference paper