Publications

4 results for Frederick Y. Wu

Automatic defect classification for semiconductor manufacturing
- - Paul B. Chou
  - A. Ravishankar Rao
  - et al.
- 1996
- Machine Vision and Applications
Algorithms for a fast confocal optical inspection system
- - A.Ravishankar Rao
  - N. Ramesh
  - et al.
- 1992
- WACV 1992
Fast confocal image processing for inspection
- - A.Ravishankar Rao
  - F.Y. Wu
  - et al.
- 1992
- SPIE Aerospace Sensing 1992
Calibration and alignmenttechniques for automated inspection of printed circuit patterns
- - Arturo A. Rodriguez
  - Jon R. Mandeville
  - et al.
- 1991
- Industrial Metrology