Charge trapping centers in N-rich silicon nitride thin filmsW.L. WarrenJerzy Kanickiet al.1992Applied Physics Letters
Low-temperature electron spin resonance investigations of silicon paramagnetic defects in silicon nitrideW.L. WarrenF.C. Ronget al.1991Applied Physics Letters
Structural identification of the silicon and nitrogen dangling-bond centers in amorphous silicon nitrideWilliam L. WarrenF. Christopher Ronget al.1991Journal of Applied Physics