Detection of current-induced vacancies in thin aluminum-copper lines using positrons
- P. Asoka-Kumar
- K. O'Brien
- et al.
- 1996
- Applied Physics Letters
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5 results for P. Asoka-Kumar
Role of implantation-induced defects in surface-oriented diffusion of fluorine in silicon
- Cs. Szeles
- B. Nielsen
- et al.
- 1994
- Journal of Applied Physics
Positron annihilation studies in the field induced depletion regions of metal-oxide-semiconductor structures
- P. Asoka-Kumar
- T.C. Leung
- et al.
- 1992
- Journal of Applied Physics
Positron annihilation at the Si/SiO2 interface
- T.C. Leung
- Z.A. Weinberg
- et al.
- 1992
- Journal of Applied Physics
SiO2/Si interface properties using positrons
- P. Asoka-Kumar
- K.G. Lynn
- et al.
- 1991
- Physical Review B