Metal–GaAs interaction and contact degradation in microwave MESFETsEnrico ZanoniAlessandro Callegariet al.2007Quality and Reliability Engineering International
Extension of Impact-Ionization Multiplication Coefficient Measurements to High Electric Fields in Advanced Si BJT’sEnrico ZanoniEmmanuel F. Crabbéet al.1993IEEE Electron Device Letters
Measurements and simulation of avalanche breakdown in advanced Si bipolar transistorsE. ZanoniE.F. Crabbeet al.1992IEDM 1992