Publications

12 results for B.N. Agarwala

Scaling effect on electromigration in on-chip Cu wiring
- - C.-K. Hu
  - R. Rosenberg
  - et al.
- 1999
- IITC 1999
Stress development, intermetallic phase formation, and reaction kinetics in Co-Cr and Co-Ti thin films
- - F. Faupel
  - D. Gupta
  - et al.
- 1990
- Journal of Applied Physics