Publications

2 results for G. Busatto

Recombination Measurement of n-Type Heavily Doped Layer in High/Low Silicon Junctions
- - Salvatore Bellone
  - Giovanni Busatto
  - et al.
- 1991
- IEEE T-ED
Recombination Lifetime Profiling in Very Thin Si Epitaxial Layers Used for Bipolar VLSI
- - Paolo Spirito
  - S. Bellone
  - et al.
- 1989
- IEEE Electron Device Letters