Publications

3 results for W.P. Hough

Lateral dopant profiling on a 100 nm scale by scanning capacitance microscopy
- - C.C. Williams
  - J. Slinkman
  - et al.
- 1990
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Lateral dopant profiling with 200 nm resolution by scanning capacitance microscopy
- - C.C. Williams
  - J. Slinkman
  - et al.
- 1989
- Applied Physics Letters
Scanning capacitance microscopy on a 25 nm scale
- - C.C. Williams
  - W.P. Hough
  - et al.
- 1989
- Applied Physics Letters