Structural, electronic, and dielectric properties of ultrathin zirconia films on silicon
- S. Sayan
- N.V. Nguyen
- et al.
- 2005
- Applied Physics Letters
Paper
Publications
9 results for David Vanderbilt
Valence and conduction band offsets of a ZrO2/SiO xNy/n-Si CMOS gate stack: A combined photoemission and inverse photoemission study
- S. Sayan
- R.A. Bartynski
- et al.
- 2004
- physica status solidi (b)
Conference paperProperties of a continuous-random-network model for amorphous systems
- Yuhai Tu
- J. Tersoff
- et al.
- 1998
- Physical Review Letters
PaperStructures of small water clusters using gradient-corrected density functional theory
- K. Laasonen
- M. Parrinello
- et al.
- 1993
- Chemical Physics Letters
PaperAb initio studies on the structural and dynamical properties of ice
- Changyol Lee
- David Vanderbilt
- et al.
- 1993
- Physical Review B
PaperAb initio studies on high pressure phases of ice
- Changyol Lee
- David Vanderbilt
- et al.
- 1992
- Physical Review Letters
PaperNegative-curvature fullerene analog of C60
- David Vanderbilt
- J. Tersoff
- 1992
- Physical Review Letters
PaperFinite-temperature phase diagram of vicinal Si(100) surfaces
- O.L. Alerhand
- A. Nihat Berker
- et al.
- 1990
- Physical Review Letters
PaperAnnealing of heavily arsenic-doped silicon: Electrical deactivation and a new defect complex
- K.C. Pandey
- A. Erbil
- et al.
- 1988
- Physical Review Letters
Paper