Publications

2 results for Denny Duan-Lee Tang

Junction Degradation in Bipolar Transistors and the Reliability Imposed Constraints to Scaling and Design
- - Denny Duan-Lee Tang
  - Edward Hackbarth
- 1988
- IEEE T-ED
Inherent and Stress-Induced Leakage in Heavily Doped Silicon Junctions
- - Edward Hackbarth
  - Denny Duan-Lee Tang
- 1988
- IEEE T-ED