Publications

9 results for Virginia H. Brecher

Automatic defect classification for semiconductor manufacturing
- - Paul B. Chou
  - A. Ravishankar Rao
  - et al.
- 1996
- Machine Vision and Applications
Recent advances in the automatic inspection of integrated circuits for pattern defects
- - Byron E. Dom
  - Virginia Brecher
- 1995
- Machine Vision and Applications
Automatic defect classification for integrated circuits
- - Paul B. Chou
  - A. ILao Ravishankar
  - et al.
- 1993
- IS&T/SPIE Electronic Imaging 1993
Recent advances in inspecting integrated circuits for pattern defects
- - Virginia H. Brecher
  - B. Dom
- 1992
- IS&T/SPIE Electronic Imaging 1992
Calibration, set-up and performance evaluation in an IC inspection system
- - B. Dom
  - Virginia H. Brecher
- 1992
- IS&T/SPIE Electronic Imaging 1992
New techniques for patterned wafer inspection based on a model of human preattentive vision
- - Virginia H. Brecher
- 1992
- SPIE Aerospace Sensing 1992
Model of human preattentive visual detection of edge orientation anomalies
- - Virginia H. Brecher
  - Raymond Bonner
  - et al.
- 1991
- SPIE Orlando 1991
The P300: An approach to automated inspection of patterned wafers
- - Virginia Brecher
  - Raymond Bonner
  - et al.
- 1989
- Proceedings of SPIE 1989
The P300: A system for automatic patterned wafer inspection
- - Byron E. Dom
  - Virginia H. Brecher
  - et al.
- 1988
- Machine Vision and Applications