Publications

4 results for P. Olivo

Charge trapping and retention in ultra-thin oxide-nitride-oxide structures
- - P. Olivo
  - Z.A. Weinberg
  - et al.
- 1991
- Solid State Electronics
Paper
Oxide-Thickness Determination in Thin-Insulator MOS Structures
- - Bruno Ricco
  - Piero Olivo
  - et al.
- 1988
- IEEE T-ED
Paper
High-Field-Induced Degradation in Ultra-Thin SiO₂ Films
- - Piero Olivo
  - Thao N. Nguyen
  - et al.
- 1988
- IEEE T-ED
Paper
Evidence of the role of defects near the injecting interface in determining SiO₂ breakdown
- - P. Olivo
  - B. Ricco
  - et al.
- 1987
- Applied Physics Letters
Paper