Publications

32 results for H.Y. Ng

EXPERIMENTAL TECHNOLOGY AND CHARACTERIZATION OF SELF-ALIGNED 0. 1 mu M-GATE-LENGTH LOW-TEMPERATURE OPERATION NMOS DEVICES.
- - G.A. Sai-Halasz
  - M.R. Wordeman
  - et al.
- 1986
- IEDM 1986
Design and Experimental Technology for 0.1-μm Gate-Length Low-Temperature Operation FET's
- - George A. Sai-Halasz
  - Matthew R. Wordeman
  - et al.
- 1987
- IEEE Electron Device Letters