Publications

22 results for P.G. May

Picosecond photoelectron scanning electron microscope for noncontact testing of integrated circuits
- - P.G. May
  - J.-M. Halbout
  - et al.
- 1987
- Applied Physics Letters
PICOSECOND ELECTRICAL PULSES FOR VLSI ELECTRONICS CHARACTERIZATION.
- - J.-M. Halbout
  - P.G. May
  - et al.
- 1986
- TMPEO 1986