Recombination Lifetime Profiling in Very Thin Si Epitaxial Layers Used for Bipolar VLSI
- Paolo Spirito
- S. Bellone
- et al.
- 1989
- IEEE Electron Device Letters
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Electrical characterization of polysilicon/monosilicon interfaces
- S. Bellone
- P. Spirito
- et al.
- 1987
- ESSDERC 1987
Recombination Measurement of n-Type Heavily Doped Layer in High/Low Silicon Junctions
- Salvatore Bellone
- Giovanni Busatto
- et al.
- 1991
- IEEE T-ED