17ps rise-time measurement by photoemission samplingA. BlachaR. Clauberget al.1987Electronics Letters
Photoemission sampling technique for high-speed integrated-circuit testingH. BehaH.K. Seitzet al.1987Microelectronic Engineering
VB-2 Laser-Induced Photoemission for Contactless High-Speed IC TestingA. BlachaR. Clauberget al.1986IEEE T-ED
Energy and time-resolved photoemission in a promising new approach for contactless integrated-circuit testingH.K. SeitzA. Blachaet al.1986Microelectronic Engineering