17ps rise-time measurement by photoemission sampling
- A. Blacha
- R. Clauberg
- et al.
- 1987
- Electronics Letters
Paper
Publications
14 results for H.K. Seitz
Photoemission sampling technique for high-speed integrated-circuit testing
- H. Beha
- H.K. Seitz
- et al.
- 1987
- Microelectronic Engineering
PaperVB-2 Laser-Induced Photoemission for Contactless High-Speed IC Testing
- A. Blacha
- R. Clauberg
- et al.
- 1986
- IEEE T-ED
PaperEnergy and time-resolved photoemission in a promising new approach for contactless integrated-circuit testing
- H.K. Seitz
- A. Blacha
- et al.
- 1986
- Microelectronic Engineering
Paper