Defect and grain boundary scattering in tungsten: A combined theoretical and experimental study
- Nicholas A. Lanzillo
- H. Dixit
- et al.
- 2018
- Journal of Applied Physics
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86 results for Phil Oldiges
First-Principles Investigations of TiGe/Ge Interface and Recipes to Reduce the Contact Resistance
- H. Dixit
- Chengyu Niu
- et al.
- 2017
- IEEE T-ED
Low Energy Proton SEUs in 32-nm SOI SRAMs at Low Vdd
- Ken Rodbell
- Michael S. Gordon
- et al.
- 2017
- IEEE TNS
Vertical Slit FET at 7-nm Node and beyond
- Ping-Lin Yang
- Terence B. Hook
- et al.
- 2016
- IEEE T-ED
Toward ultimate scaling of MOSFET
- Ramachandran Muralidhar
- Isaac Lauer
- et al.
- 2016
- IEEE T-ED
Hybrid methodology to model random dopant fluctuations in low doped FinFETs
- Samarth Agarwal
- Jeffrey B. Johnson
- et al.
- 2015
- Journal of Computational Electronics
Super fast physics-based methodology for accurate memory yield prediction
- Rajiv V. Joshi
- Keunwoo Kim
- et al.
- 2015
- IEEE Transactions on VLSI Systems
Metal-gate granularity-induced threshold voltage variability and mismatch in Si gate-all-around nanowire n-MOSFETs
- Kaushik Nayak
- Samarth Agarwal
- et al.
- 2014
- IEEE T-ED
Finite element based three dimensional Schrödinger solver for nano-scale devices
- Samarth Agarwal
- Kai Xiu
- et al.
- 2014
- Journal of Computational Electronics
Negative differential conductivity and carrier heating in gate-all-around Si nanowire FETs and its impact on CMOS logic circuits
- Kaushik Nayak
- Mohit Bajaj
- et al.
- 2014
- Japanese Journal of Applied Physics