Impact of substrate bias on GIDL for thin-BOX ETSOI devices
- Pranita Kulkarni
- Q. Liu
- et al.
- 2011
- SISPAD 2011
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86 results for Phil Oldiges
Critical analysis of 14nm device options
- Phil Oldiges
- R. Muralidhar
- et al.
- 2011
- SISPAD 2011
Sub-25nm FinFET with advanced fin formation and short channel effect engineering
- Tenko Yamashita
- Veeraraghvan S. Basker
- et al.
- 2011
- VLSI Technology 2011
Modeling of width-quantization-induced variations in logic FinFETs for 22nm and beyond
- Chung-Hsun Lin
- Wilfried Haensch
- et al.
- 2011
- VLSI Technology 2011
Non-planar device architecture for 15nm node: FinFET or trigate?
- Chung-Hsun Lin
- Josephine Chang
- et al.
- 2010
- IEEE International SOI Conference 2010
Stacked devices for SEU immune design
- Phil Oldiges
- Kenneth P. Rodbell
- et al.
- 2010
- IEEE International SOI Conference 2010
Hot-carrier degradation in undoped-body etsoi fets and soi finfets
- Miaomiao Wang
- Pranita Kulkarni
- et al.
- 2010
- IRPS 2010
On the systematic analysis of ring-delay performance using statistical behavior model
- Q. Liang
- B. Greene
- et al.
- 2009
- ISDRS 2009
SOI series MOSFET for embedded high voltage applications and soft-error immunity
- Jin Cai
- Tak Ning
- et al.
- 2008
- IEEE International SOI Conference 2008
Device scaling of high performance MOSFET with metal gate high-K at 32nm technology node and beyond
- Xinlin Wang
- Ghavam Shahidi
- et al.
- 2008
- SISPAD 2008