Effect of substrate temperature on the microstructure of thin-film silicide
- U. Köster
- K.N. Tu
- et al.
- 2008
- Applied Physics Letters
Paper
Publications
9 results for U. Köster
In situ x-ray studies of rapid crystallization of amorphous NiZr2
- S. Brauer
- J.O. Ström-Olsen
- et al.
- 1992
- Physical Review B
PaperNanocrystalline materials by crystallization of metal-metalloid glasses
- U. Köster
- U. Schünemann
- et al.
- 1991
- Materials Science and Engineering: A
PaperProperties of interfaces in (Cdzn)S/culnse2heterojunctions
- J.E. Lewis
- P.S. Ho
- et al.
- 1984
- JVSTA
PaperMaterial reactions Al/Pd2Si/Si junctions. II. Kinetic rates
- P.S. Ho
- J.E. Lewis
- et al.
- 1982
- Journal of Applied Physics
PaperMaterial reactions in Al/Pd2Si/Si junctions. I. Phase stability
- U. Köster
- P.S. Ho
- et al.
- 1982
- Journal of Applied Physics
PaperThermal reactions between aluminum and palladium layered films
- U. Köster
- P.S. Ho
- et al.
- 1980
- Thin Solid Films
PaperContact reactions between amorphous silicon and single-crystal metallic films
- U. Köster
- D.R. Campbell
- et al.
- 1978
- Thin Solid Films
PaperCrystallization of amorphous silicon films
- U. Köster
- 1978
- physica status solidi (a)
Paper